Effect of applied stress on remagnetization and magnetization profile of Co-Si-B amorphous wire

Journal of Magnetism and Magnetic Materials

Volumn 258-259, Issue , 2003, Pages 189-191

  Zhukova, V ^a   Zhukov, A ^b,c   Blanco, J M ^d   Usov, N ^e   Gonzalez, J ^a  

^a UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^c TAMag Iberica SL   (Spain)

^d EUITI   (Spain)

^e TROITSK INSTITUTE FOR INNOVATION AND FUSION RESEARCH   (Russian Federation)

Author keywords

Critical length; Large Barkhausen jump; Magnetization profile; Switching field

Indexed keywords

AMORPHOUS MATERIALS; COBALT ALLOYS; COBALT COMPOUNDS; COERCIVE FORCE; ELECTRIC COILS; MAGNETIC ANISOTROPY; MAGNETIC HYSTERESIS; MAGNETOSTATICS; REMANENCE; TENSILE STRESS;

AMORPHOUS WIRES;

WIRE;

EID: 15744396420     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(02)01041-7     Document Type: Conference Paper

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