Effect of applied stress on remagnetization and magnetization profile of Co-Si-B amorphous wire

Journal of Magnetism and Magnetic Materials

Volumn 242-245, Issue , 2002, Pages 1439-1442

  Zhukova, V ^a   Zhukov, A ^b,c   Blanco, J M ^d   Gonzalez, J ^a,e  

^a UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^c TAMag SL c/   (Spain)

^d EUITI   (Spain)

^e DONOSTIA INTERNATIONAL PHYSICS CENTER DIPC   (Spain)

Author keywords

Critical length; Large Barkhausen jump; Magnetization profile; Switching field

Indexed keywords

AMORPHOUS MATERIALS; COBALT ALLOYS; COERCIVE FORCE; MAGNETIC HYSTERESIS; MAGNETIC MATERIALS; MAGNETIZATION; STRESS ANALYSIS; TENSILE STRESS;

MAGNETIC BISTABILITIES; REMAGNETIZATION;

ELECTRIC WIRE;

EID: 0036543556     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(01)01084-8     Document Type: Article

References (10)