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Volumn 16, Issue 4, 2005, Pages 441-445

A minimum thickness gate valve with integrated ion optics for mass spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

IONS; MASS SPECTROMETRY; OPTICS;

EID: 15744362499     PISSN: 10440305     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jasms.2004.12.010     Document Type: Article
Times cited : (11)

References (11)
  • 1
    • 15744403267 scopus 로고
    • Vacuum lock for the direct insertion of samples into a mass spectrometer
    • G.A. Junk, H.J. Svec Vacuum lock for the direct insertion of samples into a mass spectrometer Anal. Chem. 37 1965 1629 1630
    • (1965) Anal. Chem. , vol.37 , pp. 1629-1630
    • Junk, G.A.1    Svec, H.J.2
  • 2
    • 0018999071 scopus 로고
    • Selection and evaluation of an ultrahigh vacuum gate valve for ISABELLE beam line vacuum system
    • C.L. Foerster, D. McCafferty Selection and evaluation of an ultrahigh vacuum gate valve for ISABELLE beam line vacuum system J. Vac. Sci. Technol. 18 1981 997 1000
    • (1981) J. Vac. Sci. Technol. , vol.18 , pp. 997-1000
    • Foerster, C.L.1    McCafferty, D.2
  • 5
    • 0030516068 scopus 로고    scopus 로고
    • Minimum profile ultrahigh vacuum gate valve based on linear/rotary motion feedthrough
    • A. Stolow Minimum profile ultrahigh vacuum gate valve based on linear/rotary motion feedthrough J. Vac. Sci. Technol. A 14 1996 2669 2670
    • (1996) J. Vac. Sci. Technol. a , vol.14 , pp. 2669-2670
    • Stolow, A.1
  • 6
    • 0001258456 scopus 로고    scopus 로고
    • Compact all-metal high-vacuum gate valve for microwave tube research
    • S.H. Gold, A.K. Kinkead, O.A. Nezhevenko Compact all-metal high-vacuum gate valve for microwave tube research Rev. Sci. Instrum. 70 1999 3770 3773
    • (1999) Rev. Sci. Instrum. , vol.70 , pp. 3770-3773
    • Gold, S.H.1    Kinkead, A.K.2    Nezhevenko, O.A.3
  • 8
    • 0031239787 scopus 로고    scopus 로고
    • External accumulation of ions for enhanced electrospray ionization Fourier transform ion cyclotron resonance mass spectrometry
    • M.W. Senko, C.L. Hendrickson, M.R. Emmett, S.D.H. Shi, A.G. Marshall External accumulation of ions for enhanced electrospray ionization Fourier transform ion cyclotron resonance mass spectrometry J. Am. Soc. Mass Spectrom. 8 1997 970 976
    • (1997) J. Am. Soc. Mass Spectrom. , vol.8 , pp. 970-976
    • Senko, M.W.1    Hendrickson, C.L.2    Emmett, M.R.3    Shi, S.D.H.4    Marshall, A.G.5
  • 9
    • 15744389918 scopus 로고    scopus 로고
    • personal communication.
    • Marshall, A. G., personal communication.
    • Marshall, A.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.