|
Volumn 16, Issue 3, 2005, Pages 177-181
|
An analysis of the distributions of electronic states associated with hydrogenated amorphous silicon
|
Author keywords
[No Author keywords available]
|
Indexed keywords
AMORPHOUS FILMS;
BAND STRUCTURE;
CRYSTALLINE MATERIALS;
DEPOSITION;
ELECTRONIC DENSITY OF STATES;
ELECTRONIC PROPERTIES;
ENERGY GAP;
HYDROGENATION;
SEMICONDUCTING SILICON;
CONDUCTION BAND;
CRYSTALLINE SILICON;
ELECTRONIC STATES;
SQUARE ROOT DISTRIBUTION OF ELECTRONIC STATES;
VALENCE BAND;
AMORPHOUS SILICON;
|
EID: 15444365698
PISSN: 09574522
EISSN: None
Source Type: Journal
DOI: 10.1007/s10854-005-6598-1 Document Type: Article |
Times cited : (12)
|
References (29)
|