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Volumn 70, Issue 2, 1999, Pages 1442-1446

Calibration of the distance between electrodes of mechanically controlled break junctions using field emission resonance

Author keywords

[No Author keywords available]

Indexed keywords

CRYOSTATS; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; ELECTRON ENERGY LEVELS; ELECTRON RESONANCE; ELECTRON TUNNELING; ELECTRONIC DENSITY OF STATES; ELECTRONS; FERMI LEVEL; METALS; OSCILLATIONS; TEMPERATURE DISTRIBUTION;

EID: 0033072705     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149602     Document Type: Article
Times cited : (27)

References (17)
  • 6
    • 22044438009 scopus 로고    scopus 로고
    • Proceedings of the 21st International Conference on Low Temperature Physics
    • N. van der Post and J. M. van Ruitenbeek, Proceedings of the 21st International Conference on Low Temperature Physics [Czech. J. Phys. 46, 2853 (1996)].
    • (1996) Czech. J. Phys. , vol.46 , pp. 2853
    • Van Der Post, N.1    Van Ruitenbeek, J.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.