Atomic scale variations of the STM tunneling distribution observed by ballistic-electron-emission microscopy

Physica Scripta T

Volumn 66, Issue , 1996, Pages 282-286

  Sirringhaus, H ^a   Meyer, T ^a   Lee, E Y ^a   Von Kanel H ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1542734827     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (26)

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26. For this estimate we use the FWHM observed for dislocations, which are known to be located at the interface. Some of the point defects might be located in the metal film, resulting in a smaller value of t.