SCOPUS 정보 검색 플랫폼

Volumn 4, Issue 2-4, 2004, Pages 233-236

The use of the X-ray absorption near edge spectrum in materials characterisation

Author keywords

Carbon anodes; Oxides; Semiconductors; XANES

Indexed keywords

EID: 1542715777 PISSN: 15671739 EISSN: None Source Type: Journal
DOI: 10.1016/j.cap.2003.11.017 Document Type: Article

Times cited : (8)

References (11)

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