Conversion of thickness data of thin films with variable lattice parameter from monolayers to angstroms: An application of the epitaxial bain path

Surface Review and Letters

Volumn 10, Issue 6, 2003, Pages 889-894

  Braun, Artur ^a,b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF KENTUCKY   (United States)

Author keywords

Bain path; Film thickness; Variable lattice parameter

Indexed keywords

CRYSTAL LATTICES; EPITAXIAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MONOLAYERS;

EPITAXIAL FILMS; IN-PLANE LATTICE SPACINGS;

THIN FILMS;

NICKEL;

ARTICLE; CHEMICAL MODIFICATION; CONCEPT FORMATION; DATA ANALYSIS; ELECTRON DIFFRACTION; EPITAXIAL BAIN PATH; EPITAXIAL FILM; FILM; LOW ENERGY ELECTRON DIFFRACTION; MATHEMATICAL ANALYSIS; MATHEMATICAL COMPUTING; SAMPLING; THICKNESS;

EID: 1542515227     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X03005761     Document Type: Article

References (11)

1. F. Bacquet, P. Geraud and O. Thomas, J. Appl. Cryst. 36, 154 (2003).
2. P. Alippi, P. M. Marcus and M. Scheffer, Phys. Rev. Lett. 78, 3892 (1997).
3. B. Feldmann, PhD thesis (RWTH, Aachen, 1996).
4. P. M. Marcus, Sur. Rev. Lett. 5, 983 (1998).
5. A. Braun, B. Feldmann and M. Wuttig, J. Magn. Magn. Mater. 171, 16 (1997).
6. P. Bruno and J.-P. Renard, Appl. Phys. A49, 499 (1989).
7. P. M. Marcus and F. Jona, Surf. Rev. Lett. 1(1), 15 (1994).
8. G. A. Prinz, J. Magn. Magn. Mater. 100, 469 (1991).
9. Landolt-Börnstein, New Series (1989), Bd. III/6, 1.1.2. 1-40.
10. G. Bochi, C. A. Ballentine, H. E. Inglefield, S. S. Bogomolov, C. V. Thompson and R. C. O'Handley, Mat. Res. Soc. Symp. Proc. 313, 309 (1993).
11. A. Braun, K. M. Briggs and P. Böni, J. Cryst. Growth 241(1/2), 231 (2002).