Scanning electrometer using the capacitive coupling in quantum Hall effect devices

Applied Physics Letters

Volumn 84, Issue 7, 2004, Pages 1111-1113

  Kawano, Y ^a   Okamoto, T ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITORS; CARRIER CONCENTRATION; ELECTRIC RESISTANCE; ELECTRODES; ELECTROMETERS; EQUIVALENT CIRCUITS; FERMI LEVEL; MAGNETIC FIELD EFFECTS; SENSORS; VOLTAGE DISTRIBUTION MEASUREMENT;

CAPACITIVE COUPLING; PARALLEL-PLATE CAPACITORS;

HALL EFFECT;

EID: 1542469574     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1647691     Document Type: Article

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15. In general, as the channel size is reduced (typically below 0.5 μm), the condition is no longer exactly quantized. However, exact quantization does not matter for an application as an electrometer. As shown in Fig. 2, oscillation of longitudinal resistance with a sweep of B is the essential feature.