Space-charge-limited current analysis in amorphous InSe thin films

Journal of Materials Science: Materials in Electronics

Volumn 15, Issue 4, 2004, Pages 225-229

  Yilmaz, K ^a   Parlak, M ^a   Ercelebi, C ^a  

^a MIDDLE EAST TECHNICAL UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELDS; ELECTRIC SPACE CHARGE; ELECTRIC VARIABLES MEASUREMENT; ELECTRONIC DENSITY OF STATES; FERMI LEVEL; GOLD; TEMPERATURE; THIN FILMS; TIN COMPOUNDS;

AMORPHOUS INDIUM SELENIDE THIN FILMS; CURRENT VOLTAGE MEASUREMENTS; ELECTRIC FIELD STRENGTH; SPACE CHARGE LIMITED CURRENT ANALYSIS; TIN OXIDE; VALENCE BAND;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 1542397816     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JMSE.0000012459.27453.c0     Document Type: Article

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