Characterization and Modeling of Ge Film Thermometers for Low Temperature Measurements

Proceedings of IEEE Sensors

Volumn 1, Issue 2, 2002, Pages 1275-1280

  Dugaev, V K ^a,b   Ihas, G G ^c   McKenney, C ^c   Kholevchuk, V V ^d,e   Mitin, V F ^d,e   Nemish, I Yu ^d   Soloviev, E A ^d   Vieira, M ^b  

^a FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

^b INSTITUTO SUPERIOR DE ENGENHARIA DE LISBOA   (Portugal)

^c UNIVERSITY OF FLORIDA   (United States)

^d INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^e MicroSensor Ltd   (Ukraine)

Author keywords

Ge films; Localization; Low temperature thermometers; Resistance thermometers

Indexed keywords

CHARACTERIZATION; CRYOGENICS; LOW TEMPERATURE OPERATIONS; MAGNETORESISTANCE; SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING GERMANIUM;

LOW-TEMPERATURE THERMOMETERS; RESISTANCE THERMOMETERS;

THERMOMETERS;

EID: 1542348526     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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