X-ray angle sorting of small-size quartz blanks using the ω-scan - State and perspective

Proceedings of the Annual IEEE International Frequency Control Symposium

Volumn , Issue , 2003, Pages 761-764

  Berger, H ^a   Bradaczek, H A ^a   Bradaczek, H ^a   Hildebrandt, G ^a  

^a EFG International   (Germany)

Author keywords

Scan Method; Cutting angle determination; Orientation non uniformity; Poly capillary collimator; Quartz blanks and wafers

Indexed keywords

CAPILLARITY; LASER BEAMS; LIGHT REFLECTION; OPTICAL COLLIMATORS; OSCILLATORS (MECHANICAL); STATISTICAL TESTS; X RAYS;

Ω-SCAN METHOD; CUTTING-ANGLE DETERMINATION; ORIENTATION NON-UNIFORMITY; POLYCAPILLARY COLLIMATOR; QUARTZ BLANKS AND WAFERS;

QUARTZ;

EID: 1542305656     PISSN: 01616404     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. B. Morys, H. Bradaczek, and G. Hildebrandt, "Improved Ω-Scan for separate measurement of true AT-cutting angles and X-miscutting angles for round quartz blanks," Proc. IEEE Int. Freq. Contr. Symp., Boston, pp. 237-240, 1994.
2. th Piezoelectr. Dev. Conf., Kansas City, pp. 12/1-12/8, 1997.
3. H. Berger, H.-A. Bradaczek, H. Pianowski, H. Bradaczek, and G. Hildebrandt, "A new quartz-blank sorting machine including optical and extended X-ray inspection", Proc. IEEE Int. Freq. Contr. Symp., Kansas City, pp. 247-249, 2000.
4. H.-A. Bradaczek, H. Bradaczek, H. Pianowski, A.V. Kononovich, and G. Hildebrandt, "A new machine for the automatic position-dependent orientation measurement of AT-cut quartz wafers", Proc. IEEE Int. Freq. Contr. Symp., Seattle, Wash., pp. 393-395, 2001.
5. th Europ.Frequ.Time Forum, St Petersburg, Russia, 2000 (in press).
6. G. Hildebrandt and H. Bradaczek, "Approaching real X-ray optics", Rigaku J., vol. 17, pp. 13-21, 2000.
7. P.J. Schields, D.M. Gibson, W.M. Gibson, N. Gao, H. Huang, and I.Yu. Ponomarev, "Overview of polycapillary X-ray optics", Powder Diffr., vol. 17, pp. 70-80, 2002.