CMOS Microsystem for AC Current Measurement with Galvanic Isolation

Proceedings of IEEE Sensors

Volumn 1, Issue 2, 2002, Pages 1445-1450

  Frick, Vincent ^a   Hebrard, Luc ^a   Poure, Philippe ^a   Anstotz, Freddy ^a   Braun, Francis ^a  

^a UNIVERSITÉ DE STRASBOURG   (France)

Author keywords

Current sensor; Galvanic isolation; Hall effect devices; Microsystem; Submicron CMOS technology

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC POTENTIAL; ELECTRIC TRANSFORMERS; HALL EFFECT; HARMONIC ANALYSIS; MATHEMATICAL MODELS; POWER CONTROL; SIGNAL PROCESSING;

CURRENT SENSORS; GALVANIC ISOLATION;

MICROSENSORS;

EID: 1542301068     PISSN: 19300395     EISSN: 21689229     Source Type: Journal    
DOI: 10.1109/ICSENS.2002.1037335     Document Type: Article

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9. Patent pending