Mössbauer spectroscopy as a powerful tool to study local electronic structure

Journal of Optoelectronics and Advanced Materials

Volumn 7, Issue 1, 2005, Pages 177-184

  Jumas, J C ^a   Robert, F ^a   Aldon, L ^a   Skordeva, E ^b  

^a UNIVERSITÉ DE MONTPELLIER   (France)

^b INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

Author keywords

Amorphous Ge Sb S; Amorphous tin composite oxide; M ssbauer spectroscopy; Phosphate coacervates; Thin films

Indexed keywords

AMORPHOUS ALLOYS; CARRIER CONCENTRATION; COMPOSITION; MOSSBAUER SPECTROSCOPY; REACTION KINETICS; THIN FILMS;

AMORPHOUS GE-SB-S; AMORPHOUS TIN COMPOSITE OXIDES; ANTIMONY CHALCOGENIDE GLASSES; PHOSPHATE COACERVATES;

ELECTRONIC STRUCTURE;

EID: 15344344113     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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