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Volumn 276, Issue 3-4, 2005, Pages 374-380
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A comparative study of the growth mechanism of InAs/GaAs and GaP/GaAs heterostructures and strained layered superlattices by atomic layer epitaxy
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Author keywords
A1. Growth method; A3. Atomic layer epitaxy; B2. Semiconducting III V materials
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DISLOCATIONS (CRYSTALS);
EPITAXIAL GROWTH;
MORPHOLOGY;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTOR GROWTH;
ATOMIC LAYER EPITAXY;
GAS CYCLE NUMBER;
LATTICE MISMATCH;
SELF LIMITING MECHANISM;
HETEROJUNCTIONS;
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EID: 15344341862
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2004.11.427 Document Type: Article |
Times cited : (11)
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References (12)
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