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Volumn 48, Issue 1, 2005, Pages 1-11

Uniformity pattern and related criteria for two-level factorials

Author keywords

Discrepancy; Generalized minimum aberration; Minimum projection uniformity; Orthogonality; Uniformity pattern; Uniformity resolution

Indexed keywords


EID: 15044352226     PISSN: 10069283     EISSN: None     Source Type: Journal    
DOI: 10.1360/03ys0155     Document Type: Article
Times cited : (32)

References (33)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.