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Volumn 53, Issue 1, 2001, Pages 85-93

A note on generalized aberration in factorial designs

b HONG KONG BAPTIST UNIVERSITY (Hong Kong)

Author keywords

Code theory; Discrepancy; Generalized wordlength pattern; Minimum aberration; Orthogonal fractional factorial designs; Uniform design; Uniformity; Wordlength pattern

Indexed keywords

EID: 0035648164 PISSN: 00261335 EISSN: None Source Type: Journal
DOI: 10.1007/s001840100112 Document Type: Article

Times cited : (129)

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