Two-color near-field eclipsing Z-scan technique for the determination of nonlinear refraction

Journal of the Optical Society of America B: Optical Physics

Volumn 14, Issue 12, 1997, Pages 3363-3367

  Marcano O , A ^a   Hernandez F E ^a   Sena, A D ^b  

^a INSTITUTO VENEZOLANO DE INVESTIGACIONES CIENTÍFICAS   (Venezuela)

^b FACULTAD DE CIENCIAS   (Venezuela)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031326510     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.14.003363     Document Type: Article

References (17)

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