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Volumn 22, Issue 3, 2005, Pages 17-23

Transitioning to lead-free assemblies

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL RESISTANCES; FILLET LIFTING; HAND SOLDERING; SOLDER BALLS; VOID FORMATIONS;

EID: 14944384773     PISSN: 15436527     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Review
Times cited : (13)

References (9)
  • 3
    • 2042536688 scopus 로고    scopus 로고
    • NEMI's lead-free alloy: Still applicable to today's commercially available alloys
    • April
    • A. Rae and C.A. Handwerker, "NEMI's Lead-Free Alloy: Still Applicable to Today's Commercially Available Alloys," Circuits Assembly, April 2004.
    • (2004) Circuits Assembly
    • Rae, A.1    Handwerker, C.A.2
  • 4
    • 34948846716 scopus 로고    scopus 로고
    • Solder joint reliability of SnAgCu Bga components attached with eutectic Pb-Sn solder paste
    • F. Hua, R. Aspandiar, T. Rothman, C. Anderson, G. Clemons and M. Klier, "Solder Joint Reliability of SnAgCu Bga Components Attached with Eutectic Pb-Sn Solder Paste," Journal of SMT, vol. 16, issue 1, 2003.
    • (2003) Journal of SMT , vol.16 , Issue.1
    • Hua, F.1    Aspandiar, R.2    Rothman, T.3    Anderson, C.4    Clemons, G.5    Klier, M.6
  • 6
    • 0038156463 scopus 로고    scopus 로고
    • August, and CDROM, August. To order: ncms.org/3portfolio/2SIGs/ECM.htm
    • NCMS Lead-Free Solder Project Final Report, August, 1997, and CDROM, August, 1999. To order: ncms.org/3portfolio/2SIGs/ECM.htm.
    • (1997) NCMS Lead-free Solder Project Final Report
  • 7
    • 54849410252 scopus 로고    scopus 로고
    • Lead-free and lead contamination
    • October
    • P. Biocca, "Lead-Free and Lead Contamination," Surface Mount Technology, October 2004.
    • (2004) Surface Mount Technology
    • Biocca, P.1
  • 9
    • 4944219736 scopus 로고    scopus 로고
    • Solid-state intermetallic compound layer growth between copper and 95.5Sn-3.9Ag-0.6Cu solder
    • P.T.Vianco, J. A. Rejentand P. F. Hlava, "Solid-State Intermetallic Compound Layer Growth Between Copper and 95.5Sn-3.9Ag-0.6Cu Solder," Journal of Electronic Materials, vol. 33, no. 9, 2004.
    • (2004) Journal of Electronic Materials , vol.33 , Issue.9
    • Vianco, P.T.1    Rejentand, J.A.2    Hlava, P.F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.