Radiometrie applications of correlated photon metrology

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5551, Issue , 2004, Pages 220-230

  Cheung, Jessica Y ^a   Chunnilall, Christopher J ^a   Wang, Jian ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Avalanche photodiode; Calibration; Coincidences; Correlated photons; Metrology; Photon counting

Indexed keywords

AVALANCHE DIODES; CALIBRATION; DATA PROCESSING; INFORMATION ANALYSIS; PHOTODETECTORS; PHOTODIODES; PHOTONS; QUANTUM THEORY; SILICON;

AVALANCHE PHOTODIODES; COINCIDENCES; CORRELATED PHOTONS; PHOTON COUNTING;

OPTICAL COMMUNICATION;

EID: 14944372065     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.561294     Document Type: Conference Paper

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