Synthetic silica glass for trace aluminium determination in quartz by electron microprobe

Geostandards Newsletter

Volumn 27, Issue 1, 2003, Pages 91-98

  Miyoshi, Naoya ^a   Satoh, Hisao ^b   Yamaguchi, Yoshiaki ^c   Masuda, Harue ^a  

^a Osaka Prefecture University   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c SHINSHU UNIVERSITY   (Japan)

Author keywords

Aluminium; Electron probe; Quartz; Reference sample; Synthetic silica glass

Indexed keywords

EID: 14944369099     PISSN: 01505505     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1751-908X.2003.tb00714.x     Document Type: Article

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