A discuss on reliability test and life period assessment for optical current sensing head

Power System Technology

Volumn 29, Issue 4, 2005, Pages 55-59

  Yu, Wen Bin ^a   Gao, Hua ^b   Guo, Zhi Zhong ^a,c  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b NORTH CHINA ELECTRIC POWER UNIVERSITY   (China)

^c ELECTRIC POWER RESEARCH INSTITUTE   (China)

Author keywords

Faraday magneto optic effect; Life assessment; Optical current sensing head(OCSH); Optical current transducer(OCT); Passive optical component; Reliability test

Indexed keywords

FAILURE ANALYSIS; LIFE CYCLE; MAGNETOOPTICAL DEVICES; MATHEMATICAL MODELS; RELIABILITY; TRANSDUCERS;

FARADAY MAGNETO-OPTIC EFFECT; LIFE ASSESSMENT; OPTICAL CURRENT SENSING HEADS (OCSH); OPTICAL CURRENT TRANSDUCERS (OCT); PASSIVE OPTICAL COMPONENTS; RELIABILITY TESTS;

SENSORS;

EID: 14944353054     PISSN: 10003673     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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