Reliability of optical connectors - Humidity behavior of the adhesive

Microelectronics Reliability

Volumn 42, Issue 9-11, 2002, Pages 1323-1328

  Caloz, François ^a   Ernsf, Daniel ^a   Rossini, Patrick ^a   Gherardi, Laura ^b   Grassi, Lisa ^b   Amaud, Jean ^b  

^a Diamond SA   (Switzerland)

^b Pirelli Labs SpA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC MATERIALS; MICROELECTRONICS;

ACCELERATION PARAMETERS; ACCELERATION TESTS; DESTRUCTIVE EFFECTS; FAILURE MECHANISM; FIELD OBSERVATIONS; HIGH HUMIDITY TESTS; OPTICAL CONNECTORS; TEMPERATURE AND HUMIDITIES;

FAILURE (MECHANICAL);

EID: 14944359661     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(02)00143-9     Document Type: Conference Paper

References (5)

1. "Generic Requirements for Singlemode Optical Connectors and Jumper Assemblies" GR326-C0RE, Issue 3, September 1999
2. UTE 80 C RDF.
3. Reliability of fiber optic interconnecting devices and passive optical components Part 9/2 : working document" IEC 62005-9-2
4. E.S.W. Kong, M.J. Adamson, Polymer Communications, 1983, vol4, pg 171
5. J. Cranck and G. S. Park, "Diffusion in Polymers", Academic Press (1968)