The real structure of YbSi1.4 - Commensurately and incommensurately modulated silicon substructures

Zeitschrift fur Anorganische und Allgemeine Chemie

Volumn 631, Issue 2-3, 2005, Pages 546-555

  Kubata, Christof ^a   Krumeich, Frank ^a   Wörle, Michael ^a   Nesper, Reinhard ^a,b  

^a LABORATORY OF INORGANIC CHEMISTRY   (Switzerland)

^b ETH ZURICH   (Switzerland)

Author keywords

Electron diffraction; Fourier analysis; HRTEM; Modulation; Superspace group; Superstructure; X ray diffraction; Ytterbium silicide

Indexed keywords

NIOBIUM; SILICON; YTTERBIUM;

AMPOULE; ARTICLE; CALCULATION; CHEMICAL MODEL; ELECTRON; EVALUATION; IMAGING; PRISM; REACTION ANALYSIS; STRUCTURE ANALYSIS; SYNTHESIS; TEMPERATURE; THERMAL ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 14844323742     PISSN: 00442313     EISSN: None     Source Type: Journal    
DOI: 10.1002/zaac.200400423     Document Type: Article

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