X-ray single crystal refinement of the Ho3Si4 structure

Journal of Alloys and Compounds

Volumn 269, Issue 1-2, 1998, Pages

  Ijjaali, I ^a   Venturini, G ^a   Malaman, B ^a  

^a INSTITUT JEAN LAMOUR   (France)

Author keywords

Crystal structure; Rare earth silicides; X ray diffraction

Indexed keywords

ANNEALING; ATOMS; COMPUTER SOFTWARE; CRYSTAL STRUCTURE; SINGLE CRYSTALS; STACKING FAULTS; X RAY DIFFRACTION;

ATOMIC SCATTERING FACTOR; MICROPROBE ANALYSIS; RARE EARTH SILICIDE; SOFTWARE PACKAGE SHELX; X RAY SINGLE CRYSTAL REFINEMENT;

HOLMIUM COMPOUNDS;

EID: 0032074855     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(97)00626-9     Document Type: Article

References (9)

1. V.N. Eremenko, K.A. Meleshevich, Yu.I. Buyanov, Sov. Non-Ferrous Met. 3 (1986) 235.
2. P. Schobinger-Papamantelos, D.B. de Mooij, K.H.J. Buschow, P. Fischer, J. Alloys Comp. 178 (1992) 151.
3. P. Schobinger-Papamantelos, K.H.J. Buschow, P. Fischer, J. Magn. Magn. Mater. 114 (1992) 131.
4. P. Schobinger-Papamantelos, K.H.J. Buschow, J. Magn. Magn. Mater. 119 (1993) 69.
5. P. Schobinger-Papamantelos, K.H.J. Buschow, J. Alloys Comp. 198 (1993) 47.
6. G.M. Sheldrick, Program for Crystal Structure Determination, University of Cambridge, UK, 1976.
7. J.A. Ibers, W.C. Hamilton (Eds.), International Tables for X-Ray Crystallography, vol. 4, Kynoch, Birmingham, 1974.
8. A. Iandelli, A. Palenzona, G.L. Olcese, J. Less-Common Metals 64 (1979) 213.
9. O. Oleksyn, P. Schobinger-Papamantelos, C. Ritter, C.H. de Groot, K.H.J. Buschow, J. Alloys Comp. 252 (1997) 53.