Electronic energy-density effects in ion tracks of metals

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 230, Issue 1-4, 2005, Pages 426-430

  Staufenbiel, F ^a   Schiwietz, G ^a   Czerski, K ^a   Roth, M ^a   Grande, P L ^b  

^a HAHN MEITNER INSTITUT   (Germany)

^b Inst De Fís Da Universidade   (Brazil)

Author keywords

Auger decay; Electron temperature; Electron spectra; Ion track potential; Multiple ionization; Neutralization; Recombination

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; BERYLLIUM; CRYSTALLINE MATERIALS; ELECTRONS; HIGH RESOLUTION ELECTRON MICROSCOPY; IONIZATION; METALLIC GLASS; SINGLE CRYSTALS;

AUGER DECAY; ELECTRON SPECTRA; ELECTRON TEMPERATURE; ION-TRACK POTENTIALS; MULTIPLE IONIZATION; NEUTRALIZATION; RECOMBINATION;

HEAVY IONS;

EID: 14744300505     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.12.078     Document Type: Conference Paper

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