Characterization of an epitaxial CaRuO3 film prepared via the sol-gel route

Thin Solid Films

Volumn 478, Issue 1-2, 2005, Pages 1-5

  Yamada, S ^a   Fukuoka, N ^a   Taniguchi, T ^a   Ozawa, T C ^a   Nagata, Y ^a   Uchida, T ^b   Samata, H ^c  

^a AOYAMA GAKUIN UNIVERSITY   (Japan)

^b TOKYO POLYTECHNIC UNIVERSITY   (Japan)

^c KOBE UNIVERSITY OF MERCANTILE MARINE   (Japan)

Author keywords

Coatings; Epitaxy; Oxides; Resistivity; Ruthenium; Sol gel

Indexed keywords

COATINGS; ELECTRIC CONDUCTIVITY; ELECTRON DIFFRACTION; EPITAXIAL GROWTH; HEAT TREATMENT; MATHEMATICAL MODELS; OXIDES; RUTHENIUM; SOL-GELS; SPIN COATING; STRONTIUM COMPOUNDS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EPITAXIAL FILMS; EPITAXIAL-GROWTH MODEL; FLUX METHOD; SPACE GROUPS;

COPPER COMPOUNDS;

EID: 14544300425     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.05.136     Document Type: Article

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