Dielectric constant, loss tangent, and surface resistance of PCB materials at K-band frequencies

IEEE Transactions on Microwave Theory and Techniques

Volumn 53, Issue 2, 2005, Pages 627-634

  Egorov, Victor N ^a   Masalov, Vladimir L ^a   Nefyodov, Yuri A ^b   Shevchun, Artem F ^b   Trunin, Mikhail R ^b   Zhitomirsky, Victor E ^c   McLean, Mick ^c  

^a E Siberian Res Inst P   (Russian Federation)

^b INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

^c Scientific Generics   (United Kingdom)

Author keywords

Anisotropy; Complex permittivity; Dielectric resonator (DR); Resonance spectrum; Surface resistance; Whispering gallery (WG) modes

Indexed keywords

ANISOTROPY; BOUNDARY CONDITIONS; DIELECTRIC MATERIALS; ELECTRIC FIELDS; FUNCTIONS; NATURAL FREQUENCIES; PARAMETER ESTIMATION; PERMITTIVITY; RESONATORS;

COMPLEX PERMITTIVITY; DIELECTRIC RESONATORS (DR); RESONANCE SPECTRUM; SURFACE RESISTANCE; WHISPERING-GALLERY (WG) MODES;

PRINTED CIRCUIT BOARDS;

EID: 14544295679     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2004.841219     Document Type: Conference Paper

References (18)

1. J. Baker-Jarvis, B. Riddle, and M. D. Janezic, "Dielectric and magnetic properties of printed wiring boards and other substrate materials," NIST, Boulder, CO, Tech. Note 1512, 1999.
2. J. Baker-Jarvis, M. D. Janezic, B. Riddle, C. L. Holloway, N. G. Paulter, and J. E. Blendell, "Dielectric and conductor-loss characterization and measurements of electronic packaging materials," NIST, Boulder, CO, NIST Tech. Note 1520, 2001.
3. A. L. Cullen and P. K. Yu, "The accurate measurement of permittivity by means of an open resonator," in Proc. Roy. Soc., vol. 325, London, U.K., 1971, pp. 493-509.
4. R. J. Cook and R. J. Jones, "Comparison of cavity and open resonator measurements of permittivity and loss angle at 35 GHz," IEEE Trans. Instrum. Meas., vol. IM-23, no. 4, pp. 438-442, Dec. 1974.
5. M. N. Afsar and K. J. Button, "Millimeter-wave dielectric measurement of materials," Proc. IEEE, vol. 73, no. 1, pp. 131-153, Jan. 1985.
6. H. E. Bussey, "Standards and measurements of microwave surface impedance, skin depth, conductivity and Q," IEEE Trans. Instrum. Meas., vol. IM-9, no. 3, pp. 171-175, Sep. 1960.
7. A. Hernandes, E. Martin, and J. M. Zamarro, "Resonant cavities for measuring the surface resistance of metals at X band frequencies," J. Phys. E., Sci. Instrum., vol. 19, pp. 222-225, 1986.
8. G. Kent, "Nondestructive permittivity measurement of substrates," IEEE Trans. Instrum. Meas., vol. 45, no. 1, pp. 102-106, Feb. 1996.
9. L. A. Vainshtein, Open Resonators and Open Waveguides (in Russian). Moscow, Russia: Sov. Radio., 1966.
10. IPC-TM-650 Test Methods Manual, Inst. Interconnecting and Packaging Electron. Circuits, Northbrook, IL, 1997.
11. T. Nishikawa, K. Wakino, H. Tanaka, and Y. Ishikawa, "Precise measurement method for complex permittivity of microwave dielectric substrate," in Precise Electromagnetic Measurements Conf. Dig., Tsukba, Japan, 1988, pp. 155-156.
12. V. F. Vzjatyshev et al., A Possibility of Superhigh Quality Resonator Creation (in Russian). Moscow, Russia: Trudy Moskovskogo Energeticheskogo Instituta, 1978, vol. 360, pp. 51-57.
13. V. N. Egorov and I. N. Mal'tseva, "Azimuthai modes in anisotropic dielectric resonator" (in Russian), Electronnaja Technika. Serija 1, Electronica SVCH, no. 2, pp. 36-39, 1984.
14. B. W. Hakki and P. D. Coleman, "A dielectric resonator method of inductive capacities in the millimeter range," IRE Trans. Microw. Theory Tech., vol. MTT-9, no. 4, pp. 402-410, Jul. 1960.
15. W. E. Courtney, "Analysis and evaluation of a method of measuring the complex permittivity and complex permeability of microwave insulators," IEEE Trans. Microw. Theory Tech., vol. MTT-19, no. 8, pp. 476-485, Aug. 1970.
16. V. F. Vzjatyshev and V. S. Dobromyslov, The Mutual Correlation of Characteristics in Multilayer Waveguides and Resonators (in Russian). Moscow, Russia: Trudy Moskovskogo Energeticheskogo Instituta, 1979, vol. 397, pp. 5-7.
17. V. N. Egorov, V. L. Masalov, Y. A. Nefyodov, A. F. Shevchun, M. R. Trunin, V. Zhitomirsky, and M. McLean, "Measuring dielectric properties and surface resistance of microwave PCS's in the K-band,", [Online]. Available: http://xxx.lanl.gov/ftp/cond-mat/papers/0312/0312151.pdf, 2003.
18. V. N. Egorov and A. S. Volovikov, "Measuring the dielectric permittivity of sapphire at temperatures 93-343 K," Radiophys. Quantum Electron., vol. 44, no. 11, pp. 885-891, 2001.