An automated method to analyze separately the microtextures of primary αp grains and the secondary αs inherited colonies in bimodal titanium alloys

Materials Characterization

Volumn 54, Issue 3, 2005, Pages 216-222

  Germain, L ^a   Gey, N ^a   Humbert, M ^a   Hazotte, A ^a   Bocher, P ^b   Jahazi, M ^c  

^a UNIVERSITÉ PAUL VERLAINE METZ   (France)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^c MCGILL UNIVERSITY   (Canada)

Author keywords

Bimodal microstructure; EBSD; Image processing; Microtexture; Ti alloys

Indexed keywords

AUTOMATION; CRYSTAL MICROSTRUCTURE; DISSOCIATION; ELECTRON BEAMS; IMAGE PROCESSING; SCANNING ELECTRON MICROSCOPY; TEXTURES;

BACK SCATTERED ELECTRON IMAGE; BIMODAL MICROSTRUCTURE; CHEMICAL CONTRAST; EBSD;

TITANIUM ALLOYS;

EID: 14544289053     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2004.11.011     Document Type: Article

References (9)

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8. Germain L, Gey N, Humbert M, Bocher P, Jahazi M. Analysis of sharp microtexture heterogeneities in bimodal IMI 834 billets. Submitted for publication.
9. L. Germain, N. Gey, M. Humbert, P. Bocher, and M. Jahazi β→α variant selection in sharp textured region of a bimodal IMI834 Proc. of the 14th Int. Conf. on Textures of Materials, Leuven, Belgium, July 11-15 2005