In-situ investigation of patterned magnetic domain structures using magnetic force microscope

IEEE Transactions on Magnetics

Volumn 35, Issue 5 PART 2, 1999, Pages 3481-3483

  Wu, J C ^a,b   Huang, H W ^a   Huang, Y W ^a   Wu, Te Ho ^a  

^a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

^b NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Electron beam lithography; Magnetic domain structures; Magnetic force microscope

Indexed keywords

ALUMINUM; ELECTRIC CURRENTS; ELECTRON BEAM LITHOGRAPHY; IRON ALLOYS; MAGNETIC DOMAINS; MAGNETIC FIELD EFFECTS; METALLIC FILMS; MICROSCOPES;

MAGNETIC DOMAIN STRUCTURES; MAGNETIC FORCE MICROSCOPES; PERMALLOY;

MAGNETIC THIN FILMS;

EID: 0033183884     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.800564     Document Type: Article

References (7)

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