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Volumn , Issue , 2004, Pages 80-83
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An efficient all-digital built-in self-test for chargepump PLL
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Author keywords
BIST; Mixed Signal Test; PLL
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Indexed keywords
BOOLEAN ALGEBRA;
COMPUTER SIMULATION;
ELECTRIC IMPEDANCE;
ERROR ANALYSIS;
FEEDBACK;
MICROPROCESSOR CHIPS;
RELIABILITY;
SIGNAL PROCESSING;
SILICON;
FEEDBACK FREQUENCY;
FREQUENCY LOCK TEST (FLT);
MIXED-SIGNAL TESTING;
TRANSMISSION GATES;
PHASE LOCKED LOOPS;
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EID: 14544271038
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (10)
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References (9)
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