EXAFS Spectroscopy - Fundamentals, Measurement Techniques, Data Evaluation and Applications in the Field of Phthalocyanines

Zeitschrift fur Physikalische Chemie

Volumn 218, Issue 1, 2004, Pages 1-15

  Krishnan, Venkata ^a   Feth, Martin P ^a   Wendel, Eric ^a   Chen, Yu ^b   Hanack, Michael ^b   Bertagnolli, Helmut ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

^b UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

Evaluation; EXAFS; Measurements; Metallophthalocyanines

Indexed keywords

EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; MEASUREMENT; SOFTWARE PACKAGES; SYNCHROTRON RADIATION;

EVALUATION; EXAFS; INTER-ATOMIC DISTANCES; METALLOPHTHALOCYANINES; PHTHALOCYANINE COMPLEXES; PHTHALOCYANINE MACROCYCLE; STRUCTURAL CHARACTERIZATION; SYNCHROTRON RADIATION SOURCE;

ATOMS;

BRIDGED COMPOUND; DIMER; MACROCYCLIC COMPOUND; METAL DERIVATIVE; PHTHALOCYANINE DERIVATIVE;

ANALYTIC METHOD; ARTICLE; CHEMICAL STRUCTURE; DATA ANALYSIS; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; ROENTGEN SPECTROSCOPY; SPECTRUM; STRUCTURE ANALYSIS; X RAY ANALYSIS;

EID: 1442349263     PISSN: 09429352     EISSN: None     Source Type: Journal    
DOI: 10.1524/zpch.218.1.1.25389     Document Type: Article

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