Liquid crystal/ITO/glass system characterization obtained by X-ray reflectivity measurements

Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals

Volumn 372, Issue , 2001, Pages 339-352

  Peruzzi, Stefano ^a   Bontempi, Elza ^a   Versace, Carlo ^b   Depero, Laura Eleonora ^a  

^a UNIVERSITY OF BRESCIA   (Italy)

^b UNIVERSITY OF CALABRIA   (Italy)

Author keywords

Alignment layer; GIXRD (Glancing Incidence X Ray Diffraction); ITO; Liquid crystal; XRR (X Ray Reflectivity)

Indexed keywords

GLASS; MICROSTRUCTURE; POLYVINYL ALCOHOLS; SILICA; THIN FILMS; X RAY DIFFRACTION;

ALIGNMENT LAYERS; GLANCING INCIDENCE X-RAY DIFFRACTION (GIXRD); GLASS SYSTEMS; X-RAY REFLECTIVITY (XRR);

LIQUID CRYSTALS;

EID: 1442340822     PISSN: 1058725X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10587250127602     Document Type: Article

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