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Optics and Laser Technology
Volumn 36, Issue 3, 2004, Pages 223-227
Optical characterization of the silicon photodiodes for the establishment of national radiometric standards
Author keywords

Silicon photodiodes; Spatial uniformity; Spectral responsivity; Trap detectors
Indexed keywords

ELECTROOPTICAL DEVICES; LASER OPTICS; LIGHT REFLECTION; NONLINEAR OPTICS; PHOTOCURRENTS; PHOTODETECTORS; RADIOMETRY; SILICON SENSORS; SPATIAL VARIABLES MEASUREMENT; SPECTRUM ANALYSIS; STANDARDS; TEMPERATURE CONTROL; VACUUM APPLICATIONS;
EID: 1442286101     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlastec.2003.08.009     Document Type: Article
Times cited : (16)
References (7)
  • 1
    • 0022111159 scopus 로고
    • A cryogenic radiometer for absolute radiometric measurements
    • Martin J.E., Fox N.P., Key P.J. A cryogenic radiometer for absolute radiometric measurements. Metrologia. 21:1985;147-155.
    • (1985) Metrologia , vol.21 , pp. 147-155
    • Martin, J.E.1    Fox, N.P.2    Key, P.J.3
  • 2
    • 25044438898 scopus 로고    scopus 로고
    • Electronic structure and properties of semiconductors
    • Chan RW, Haasen P, Cramer EJ, editors, Switzerland: Trans Tech Publications Ltd
    • Schröter W. Electronic structure and properties of semiconductors. In: Chan RW, Haasen P, Cramer EJ, editors. Material science and technology: a comprehensive study, vol. 4. Switzerland: Trans Tech Publications Ltd; 1998. p. 220-1.
    • (1998) Material Science and Technology: A Comprehensive Study , vol.4 , pp. 220-221
    • Schröter, W.1
  • 3
    • 0041134814 scopus 로고
    • Uniformity of quantum efficiency of single and trap configured silicon photodiodes
    • White M.G., Bittar A. Uniformity of quantum efficiency of single and trap configured silicon photodiodes. Metrologia. 30:1993;361-364.
    • (1993) Metrologia , vol.30 , pp. 361-364
    • White, M.G.1    Bittar, A.2
  • 4
    • 0036036344 scopus 로고    scopus 로고
    • Spatial non-uniformity measurements of large area silicon photodiodes
    • Durak M., Samedov F., Turkoglu A.K. Spatial non-uniformity measurements of large area silicon photodiodes. Turkish Journal of Physics. 26:2002;375-380.
    • (2002) Turkish Journal of Physics , vol.26 , pp. 375-380
    • Durak, M.1    Samedov, F.2    Turkoglu, A.K.3
  • 5
    • 0001256998 scopus 로고
    • Photodiode nonlinearity measurement with an intensity stabilized laser as a radiation source
    • Fischer J., Fu L. Photodiode nonlinearity measurement with an intensity stabilized laser as a radiation source. Appl Opt. 32:1993;4187-4190.
    • (1993) Appl Opt , vol.32 , pp. 4187-4190
    • Fischer, J.1    Fu, L.2
  • 6
    • 0000580494 scopus 로고    scopus 로고
    • The NIST high accuracy scale for absolute spectral response from 409 to 920 nm
    • Larason T.C., Bruce S.S., Cromer C.L. The NIST high accuracy scale for absolute spectral response from 409 to 920 nm. J Res Natl Inst Stand Technol. 101:1996;133-140.
    • (1996) J Res Natl Inst Stand Technol , vol.101 , pp. 133-140
    • Larason, T.C.1    Bruce, S.S.2    Cromer, C.L.3
  • 7
    • 0026461497 scopus 로고
    • Optical functions of silicon determined by two-channel polarization modulation elipsometry
    • Jellison G.E. Jr. Optical functions of silicon determined by two-channel polarization modulation elipsometry. Opt Mater. 1:1992;41-47.
    • (1992) Opt Mater , vol.1 , pp. 41-47
    • Jellison Jr., G.E.1

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.