Crystallite size and lattice strain in nanocrystalline Ni-Mo alloys studied by Rietveld refinement

Journal of Alloys and Compounds

Volumn 367, Issue 1-2, 2004, Pages 235-238

  Karolus, M ^a   Lagiewka E ^a  

^a UNIVERSITY OF SILESIA   (Poland)

Author keywords

Nanostructure; X ray diffraction

Indexed keywords

ANISOTROPY; CURRENT DENSITY; ELECTRODEPOSITION; EXTRAPOLATION; FLUORESCENCE; LATTICE CONSTANTS; NANOSTRUCTURED MATERIALS; PHASE COMPOSITION; SPUTTERING; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

LATTICE STRAIN; NANOSTRUCTURES; RIETVELD REFINEMENTS;

NICKEL ALLOYS;

EID: 1442285948     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2003.08.044     Document Type: Conference Paper

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