Microtechnology, Nanotechnology, and the Scanning-Probe Microscope: An Innovative Course

IEEE Transactions on Education

Volumn 47, Issue 1, 2004, Pages 51-56

  Adams, Jesse D ^a   Rogers, Ben S ^a   Leifer, Larry J ^b  

^a University of Nevada   (United States)

^b Stanford University   (United States)

Author keywords

Course; Kolb learning cycle; Microtechnology; Nanotechnology; Scanning probe microscope (SPM); Small systems; Technology transfer

Indexed keywords

CURRICULA; ENGINEERING RESEARCH; INTERNET; LEARNING SYSTEMS; MICROSCOPIC EXAMINATION; NANOTECHNOLOGY; STUDENTS; TECHNOLOGY TRANSFER;

LEARNING CYCLES; MICROTECHNOLOGY;

ENGINEERING EDUCATION;

EID: 1442264306     PISSN: 00189359     EISSN: None     Source Type: Journal    
DOI: 10.1109/TE.2003.817623     Document Type: Article

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