Parameter measurement of the cylindrically curved thin layer using low-frequency circumferential Lamb waves

Ultrasonics

Volumn 43, Issue 5, 2005, Pages 357-364

  Chen, Xiao ^a   Wan, Mingxi ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Lamb wave; Material characterization; Thin layer; Ultrasonic

Indexed keywords

BANDWIDTH; BESSEL FUNCTIONS; ERROR ANALYSIS; FREQUENCY DOMAIN ANALYSIS; TRANSFER FUNCTIONS; ULTRASONIC WAVES; ULTRASONICS;

LAME WAVES; MATERIAL CHARACTERIZATION; NEUMANN FUNCTIONS; THIN LAYERS;

ULTRASONIC TESTING;

EID: 13944261649     PISSN: 0041624X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultras.2004.07.005     Document Type: Article

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