Raman spectroscopy and electroreflectance studies of self-assembled SiGe nanoislands grown at various temperatures

Physics of the Solid State

Volumn 47, Issue 1, 2005, Pages 54-57

  Valakh, M Ya ^a   Holiney, R Yu ^a   Dzhagan, V N ^a   Krasil'nik, Z F ^b   Lytvyn, O S ^a   Lobanov, D N ^b   Milekhin, A G ^c   Nikiforov, A I ^c   Novikov, A V ^b   Pchelyakov, O P ^c   Yukhymchuk, V A ^a  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^b INSTITUTE FOR PHYSICS OF MICROSTRUCTURES   (Russian Federation)

^c INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 13944254793     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1853444     Document Type: Conference Paper

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