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Volumn 531, Issue 2, 2005, Pages 285-291
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Wavelet neural network-based QSPR for prediction of critical micelle concentration of Gemini surfactants
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Author keywords
cmc; Gemini surfactants; MLR; QSPR; WNN
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Indexed keywords
COMPUTER ARCHITECTURE;
COMPUTER SOFTWARE;
ERROR ANALYSIS;
MATHEMATICAL MODELS;
NEURAL NETWORKS;
SURFACE ACTIVE AGENTS;
AVERAGE ABSOLUTE ERROR;
DATA SETS;
DRAGON DESCRIPTORS;
WAVELET NEURAL NETWORKS (WNN);
MICELLES;
SURFACTANT;
ANALYTICAL ERROR;
ARTICLE;
ARTIFICIAL NEURAL NETWORK;
CALIBRATION;
CHEMICAL MODEL;
COMPARATIVE STUDY;
COMPUTER PROGRAM;
MICELLE;
MICELLIZATION;
PRIORITY JOURNAL;
QUANTITATIVE STRUCTURE PROPERTY RELATION;
STRUCTURE ANALYSIS;
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EID: 13844276920
PISSN: 00032670
EISSN: None
Source Type: Journal
DOI: 10.1016/j.aca.2004.10.028 Document Type: Article |
Times cited : (37)
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References (32)
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