Effect of substrate vicinality on the formation of precipitates and twins in YBa2Cu3O7-δ thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 21, 2004, Pages 1-6

  Chakalova, R I ^a   Jackson, T J ^a   Passerieux, G ^a   Jones, I P ^a   Mikheenko, P ^a   Muirhead, C M ^a   Darlington, C N W ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ARTICLE; CHEMICAL COMPOSITION; CRYSTAL STRUCTURE; FILM; GEOMETRY; PRECIPITATION; SURFACE PROPERTY;

EID: 13844256209     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.214504     Document Type: Article

References (22)

1. D. G. Schlom, D. Anselmetti, J. G. Bednorz, R. F. Broom, A. Catana, T. Frey, C. Gerber, H.-J. Güntherodt, H. P. Lang, and J. Mannhart, Z. Phys. B: Condens. Matter 86, 163 (1992).
2. T. Haage, H.-U. Habermeier, and J. Zegenhagen, Surf. Sci. 370, L158 (1997).
3. J. M. Dekkers, G. Rijnder, S. Harkema, H. J. H. Smilde, H. Hilgenkamp, H. Rogalla, and D. H. A. Blank, Appl. Phys. Lett. 83, 5199 (2003).
4. J. Brötz, H. Fuess, T. Haage, and J. Zegenhagen, Phys. Rev. B 57, 3679 (1998).
5. W. F. Hu, L. I. Lin, X. J. Zhao, W. Liu, Y. F. Chen, T. S. Wang, and X. G. Qui, Chin. Phys. Lett. 18, 91 (2001).
6. T. J. Jackson, J. S. Abell, R. A. Chakalov, M. S. Colclough, C. N. W. Darlington, I. P. Jones, G. Kong, C. M. Muirhead, and F. Wellhöfer, Thin Solid Films 468, 332 (2004).
7. G. Koster, B. L. Kropman, G. J. H. M. Rijnders, D. H. A. Blank, and H. Rogalla, Appl. Phys. Lett. 73, 2920 (1998).
8. R. A. Chakalov, F. Wellhöfer, S. Corner, M. Allsworth, and C. M. Muirhead, Inst. Phys. Conf. Ser. 167, 129 (2000).
9. J. D. Budai, R. Feenstra, and L. A. Boatner, Phys. Rev. B 39, 12355 (1989).
10. J. D. Budai, M. F. Chrisholm, R. Feenstra, D. H. Lowndes, D. P. Norton, L. A. Boatner, and D. H. Christen, Appl. Phys. Lett. 58, 2174 (1991).
11. J. Brötz and H. Fuess, Physica C 339, 75 (2000).
12. T. Haage, J. Zegenhagen, J. Q. Li, H.-U. Habermeier, M. Cardona, C. Jooss, R. Warthmann, A. Forkl, and H. Kronmüller, Phys. Rev. B 56, 8404 (1997).
13. J. Zegenhagen, T. Haage, and Q. D. Jiang, Appl. Phys. A: Mater. Sci. Process. 67, 711 (1998).
14. V. K. Wadhawan, Phys. Rev. B 38, 8936 (1988).
15. H. Yamasaki, Y. Nakagawa, A. Sawa, H. Obara, and K. Develos, Physica C 372-376, 1885 (2002).
16. D. G. Crété, S. Berger, K. Bouzehouane, J. Briatico, J. P. Contour, O. Durand, J. L. Maurice, and K. van der Beek, Physica C 372-376, 634 (2002).
17. L. Méchin, P. Berghuis, and J. E. Evetts, Physica C 302, 102 (1998).
18. W.-F. Hu, X.-J. Zhao, W. Peng, T.-S. Wang, W. Liu, L. Li, C. Lei, Y. F. Chen, and L. Li, J. Cryst. Growth 231, 493 (2001).
19. Powder Diffraction Files of the International Centre for Diffraction Data (1997).
20. M. Kawasaki, Science 266, 5190 (1994).
21. J.-L. Maurice, J. Briatico, D.-G. Crété, J.-P. Contour, and O. Durand, Phys. Rev. B 68, 115429 (2003).
22. J. M. Huibregtse, J. H. Rector, and B. Dam, Physica C 351, 183 (2001).