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Volumn 76, Issue 2, 2005, Pages
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Ultrahigh vacuum apparatus for quartz crystal microbalance measurements in the temperature range 4-400 K
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Author keywords
[No Author keywords available]
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Indexed keywords
FILM GROWTH;
FRICTION;
STAINLESS STEEL;
TEMPERATURE MEASUREMENT;
THIN FILMS;
ULTRAHIGH VACUUM;
AMPLITUDE STABILITY;
QUARTZ CRYSTAL MICROBALANCE (QCM) TECHNIQUES;
SLIDING FRICTION;
SUBMONOLAYERS;
QUARTZ;
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EID: 13744259716
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1848661 Document Type: Article |
Times cited : (14)
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References (13)
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