SCOPUS 정보 검색 플랫폼

Volumn 25, Issue 3-4, 2005, Pages 392-395

Process reliability assessment with a Bayesian approach

Author keywords

Bayesian; Process incapability index

Indexed keywords

ENTROPY; MATHEMATICAL OPERATORS; MAXIMUM LIKELIHOOD ESTIMATION; PRINTED CIRCUIT BOARDS; PROBABILITY DENSITY FUNCTION; PROCESS CONTROL; RELIABILITY;

BAYESIAN; CHI-SQUARED DISTRIBUTION; GAMMA DISTRIBUTION; PROCESS INCAPABILITY INDEX;

NORMAL DISTRIBUTION;

EID: 13744256005 PISSN: 02683768 EISSN: None Source Type: Journal
DOI: 10.1007/s00170-003-1807-7 Document Type: Article

Times cited : (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.