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Volumn 24, Issue 11-12, 2004, Pages 841-846

Upper limits of the estimated incapability index: A practical application on the reliability assessment of printed circuit boards

Author keywords

Asymmetric; Incapability index; Quality assurance; Reliability

Indexed keywords

MICROELECTRONICS; PRINTED CIRCUIT BOARDS; PROBABILITY DENSITY FUNCTION; QUALITY ASSURANCE; RELIABILITY; STATISTICAL METHODS;

EID: 10844254926     PISSN: 02683768     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00170-003-1795-7     Document Type: Article
Times cited : (8)

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  • 5
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  • 6
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.