Refinement of the Si-O-Si bond angle distribution in vitreous silica

Journal of Physics Condensed Matter

Volumn 17, Issue 5 SPEC. ISS., 2005, Pages

  Tucker, M G ^a   Keen, D A ^b,c   Dove, M T ^a   Trachenko, K ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA REDUCTION; MATHEMATICAL MODELS; MOLECULAR DYNAMICS; MONTE CARLO METHODS; NEUTRON DIFFRACTION; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; PARAMETER ESTIMATION; X RAY DIFFRACTION ANALYSIS;

BOND ANGLE DISTRIBUTION; COULOMB INTERACTION; DISORDERED STRUCTURES; RMC;

FUSED SILICA;

EID: 13644284037     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/17/5/008     Document Type: Conference Paper

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