-
3
-
-
0031273753
-
Structure of the GaAs/InP interface obtained by direct wafer bonding optimised for surface emitting optical devices
-
G. Patriarche F. Jeannès J.-L. Oudar F. Glas Structure of the GaAs/InP interface obtained by direct wafer bonding optimised for surface emitting optical devices J. Appl. Phys. 82 1997 4892-4903
-
(1997)
J. Appl. Phys.
, vol.82
, pp. 4892-4903
-
-
Patriarche, G.1
Jeannès, F.2
Oudar, J.-L.3
Glas, F.4
-
4
-
-
0343553989
-
HRPACK: A software describing the elastic fields near dislocations and interfaces at atomic scale
-
R. Bonnet M. Loubradou HRPACK: A software describing the elastic fields near dislocations and interfaces at atomic scale Ultramicroscopy 69 1997 241-257
-
(1997)
Ultramicroscopy
, vol.69
, pp. 241-257
-
-
Bonnet, R.1
Loubradou, M.2
-
5
-
-
0018544815
-
TEM observations on grain boundaries in sintered silicon
-
H. Föll D. Ast TEM observations on grain boundaries in sintered silicon Philos. Mag. A 40 1979 589-610
-
(1979)
Philos. Mag. A
, vol.40
, pp. 589-610
-
-
Föll, H.1
Ast, D.2
-
6
-
-
0000654250
-
60° dislocations in (001) GaAs/Si interfaces
-
J.G. Zhu C.B. Carter 60° dislocations in (001) GaAs/Si interfaces Philos. Mag. A 62 1990 319-328
-
(1990)
Philos. Mag. A
, vol.62
, pp. 319-328
-
-
Zhu, J.G.1
Carter, C.B.2
-
7
-
-
0037647817
-
Analyse du contraste d'un sous-joint de torsion (001) dans le silicium en MET à deux ondes
-
R. Bonnet K. Rousseau F. Fournel Analyse du contraste d'un sous-joint de torsion (001) dans le silicium en MET à deux ondes C. R. Physique 3 2002 657-663
-
(2002)
C. R. Physique
, vol.3
, pp. 657-663
-
-
Bonnet, R.1
Rousseau, K.2
Fournel, F.3
-
8
-
-
0348245749
-
Huge differences between low- and high-angle twist grain boundaries: The case of ultrathin (001) films bonded to (001) Si wafers
-
J.L. Rouvière K. Rousseau F. Fournel H. Moriceau Huge differences between low- and high-angle twist grain boundaries: The case of ultrathin (001) films bonded to (001) Si wafers Appl. Phys. Lett. 77 2000 1135-1137
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 1135-1137
-
-
Rouvière, J.L.1
Rousseau, K.2
Fournel, F.3
Moriceau, H.4
-
9
-
-
13644271719
-
Overview on some recent advances in wafer bonding technologies
-
H. Baumgart C.E. Hunt (Eds.)
-
H. Moriceau F. Fournel O. Rayssac A.M. Cartier C. Morales S. Pocas M. Zussy E. Jalaguier B. Biasse B. Bataillou A.M. Papon C. Lagahe B. Aspar C. Maleville F. Letertre B. Ghyselen T. Barge Overview on some recent advances in wafer bonding technologies, in: H. Baumgart C.E. Hunt (Eds.). Semiconductor Wafer Bonding Science: Technology and Applications VI, Electrochemical Society Proceedings 2001 1-16
-
(2001)
Semiconductor Wafer Bonding Science: Technology and Applications VI, Electrochemical Society Proceedings
, pp. 1-16
-
-
Moriceau, H.1
Fournel, F.2
Rayssac, O.3
Cartier, A.M.4
Morales, C.5
Pocas, S.6
Zussy, M.7
Jalaguier, E.8
Biasse, B.9
Bataillou, B.10
Papon, A.M.11
Lagahe, C.12
Aspar, B.13
Maleville, C.14
Letertre, F.15
Ghyselen, B.16
Barge, T.17
-
10
-
-
13644275614
-
Etching of dislocations permits fabrication of 100 atom wide nanostructures on silicon
-
mai-juin
-
S. Sas, M. Hines, Etching of dislocations permits fabrication of 100 atom wide nanostructures on silicon, Materials Today, mai-juin 2001, p. 5
-
(2001)
Materials Today
, pp. 5
-
-
Sas, S.1
Hines, M.2
-
13
-
-
20444369477
-
The continuum theory of lattice defects
-
J.D. Eshelby The continuum theory of lattice defects Solid State Phys. 31 1956 79-144
-
(1956)
Solid State Phys.
, vol.31
, pp. 79-144
-
-
Eshelby, J.D.1
-
14
-
-
0000590518
-
Atomic positions around misfit dislocations on a planar heterointerface
-
R. Bonnet M. Loubradou Atomic positions around misfit dislocations on a planar heterointerface Phys. Rev. B 49 1994 14397-14402
-
(1994)
Phys. Rev. B
, vol.49
, pp. 14397-14402
-
-
Bonnet, R.1
Loubradou, M.2
-
15
-
-
0022028632
-
On the use of Somigliana dislocations to describe some interfacial defects
-
R. Bonnet G. Marcon A. Ati On the use of Somigliana dislocations to describe some interfacial defects Philos. Mag. A 51 1985 429-448
-
(1985)
Philos. Mag. A
, vol.51
, pp. 429-448
-
-
Bonnet, R.1
Marcon, G.2
Ati, A.3
-
16
-
-
4644342585
-
Evaluation of surface strain due to the reconstruction of atomically close-packed crystalline surfaces
-
R. Bonnet Evaluation of surface strain due to the reconstruction of atomically close-packed crystalline surfaces Phys. Rev. B 61 2000 14059-14065
-
(2000)
Phys. Rev. B
, vol.61
, pp. 14059-14065
-
-
Bonnet, R.1
-
17
-
-
0020736207
-
The elastic field of a Volterra dislocation in a planar phase boundary
-
R. Bonnet The elastic field of a Volterra dislocation in a planar phase boundary Philos. Mag. A 47 1988 529-536
-
(1988)
Philos. Mag. A
, vol.47
, pp. 529-536
-
-
Bonnet, R.1
-
18
-
-
0000929676
-
The determination of the elastic field of an ellipsoidal inclusion, and related problems
-
J.D. Eshelby The determination of the elastic field of an ellipsoidal inclusion, and related problems Proc. Roy. Soc. London Ser. A 241 1957 376-396
-
(1957)
Proc. Roy. Soc. London Ser. A
, vol.241
, pp. 376-396
-
-
Eshelby, J.D.1
-
19
-
-
0023536846
-
Contraste en MET à deux ondes d'une dislocation rectiligne parallèle à la surface libre d'un cristal anisotrope
-
R. Bonnet A.J. Morton Contraste en MET à deux ondes d'une dislocation rectiligne parallèle à la surface libre d'un cristal anisotrope Philos. Mag. A 56 1987 815-830
-
(1987)
Philos. Mag. A
, vol.56
, pp. 815-830
-
-
Bonnet, R.1
Morton, A.J.2
-
20
-
-
13644276060
-
Observations on dislocation nodes in silicon
-
G.R. Booker L.M. Brown Observations on dislocation nodes in silicon Philos. Mag. 11 1965 1315-1319
-
(1965)
Philos. Mag.
, vol.11
, pp. 1315-1319
-
-
Booker, G.R.1
Brown, L.M.2
-
21
-
-
84996180896
-
The direct observation of dislocation nets in rock salt single crystals
-
S. Amelinckx The direct observation of dislocation nets in rock salt single crystals Philos. Mag. 1 1956 269-290
-
(1956)
Philos. Mag.
, vol.1
, pp. 269-290
-
-
Amelinckx, S.1
-
22
-
-
0003427458
-
-
3ème impression Reading, USA: Addison-Wesley
-
B.D. Cullity Elements of X-Ray Diffraction 3ème impression 1967 Addison-Wesley Reading, USA p. 484
-
(1967)
Elements of X-Ray Diffraction
, pp. 484
-
-
Cullity, B.D.1
-
23
-
-
0014814335
-
The dislocation loop near a free surface
-
P.P. Groves D.J. Bacon The dislocation loop near a free surface Philos. Mag. 22 1970 83-91
-
(1970)
Philos. Mag.
, vol.22
, pp. 83-91
-
-
Groves, P.P.1
Bacon, D.J.2
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