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Volumn 6, Issue 1 SPEC. ISS., 2005, Pages 145-150

Dense networks of interfacial linear defects and Somigliana dislocations;Réseaux denses de défauts linéaires interfaciaux et dislocations de Somigliana

Author keywords

Dislocation; Elastic field; Interface; Somigliana

Indexed keywords


EID: 13644272564     PISSN: 16310705     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.crhy.2004.11.012     Document Type: Article
Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.