Optimization of electron beam focusing for CNT-FEDs

Technical Digest of the 17th International Vacuum Nanoelectronics Conference, IVNC 2004

Volumn , Issue , 2004, Pages 32-33

  Choi, Jun Hee ^a   Zoulkarneev, Andrei R ^a   Jin, Yong Wan ^a   Park, Young Jun ^a   Chung, Deuk Seok ^a   Song, Byung Kwon ^a   Han, In Taek ^a   Kim, Ha Jin ^a   Lee, Hang Woo ^a   Park, Sang Hyun ^a   Kang, Ho Suk ^a   Shin, Mun Jin ^a   Kim, Ha Jong ^a   Min, Kyung Won ^a   Kim, Jung Woo ^a   Jung, Jae Eun ^a   Kim, Jong Min ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CARBON NANOTUBES; CHARGE COUPLED DEVICES; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELDS; FIELD EMISSION DISPLAYS; FOCUSING; OPTIMIZATION; SCANNING ELECTRON MICROSCOPY;

CONCAVE GEOMETRY; ELECTRON BEAM FOCUSING; ELECTRON-BEAM FOCUSING STRUCTURE (EFS); FOCUS GATE HOLE;

ELECTRON BEAMS;

EID: 13644258452     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. Z. F. Ren et al, Appl. Phys. Lett. 75, 1086 (1999).
2. S. H. Jo et al, Appl. Phys. Lett. 82, 3520 (2003).
3. J.H. Choi et al, Appl. Phys. Lett. 84, 1022 (2004).
4. J. H. Choi and A. N. Zoulkarneev, Korea Patent Pending, 2003-0055883.