Ballistic-electron emission microscopy as a probe for surface science

Surface Science

Volumn 357-358, Issue , 1996, Pages 386-393

  Sirringhaus, H ^a   Meyer, T ^a   Lee, E Y ^a   Von Kanel H ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

Ballistic electron emission microscopy (BEEM); Cobalt; Cobalt silicide; Electron solid interactions, scattering, diffraction; Metal semiconductor interfaces; Molecular beam epitaxy; Scanning tunneling microscopy; Scanning tunneling spectroscopies

Indexed keywords

COBALT; CRYSTAL ATOMIC STRUCTURE; DISLOCATIONS (CRYSTALS); ELECTRON EMISSION; ELECTRON TUNNELING; EPITAXIAL GROWTH; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; POINT DEFECTS; SCANNING TUNNELING MICROSCOPY; SCHOTTKY BARRIER DIODES; SURFACES;

ATOMIC SCALE PERIODICITY; BALLISTIC ELECTRON EMISSION MICROSCOPY; BALLISTIC ELECTRON EMISSION SPECTROSCOPY; COBALT SILICIDE; ELECTRON SOLID INTERACTIONS; ENERGY DISTRIBUTION; METAL SEMICONDUCTOR INTERFACES; SINGLE CRYSTAL EPITAXY; SINGLE CRYSTAL SURFACES; SURFACE TOPOGRAPHY;

ELECTRON MICROSCOPY;

EID: 13544255880     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00186-0     Document Type: Article

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