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Physical Review Letters

Volumn 73, Issue 4, 1994, Pages 577-580

Hot Carrier Scattering at Interfacial Dislocations Observed by Ballistic-Electron-Emission Microscopy

(3) Sirringhaus, H a Lee, E Y a Von Kanel H a

a ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; COBALT COMPOUNDS; DISLOCATIONS (CRYSTALS); DOPING (ADDITIVES); FILM GROWTH; INTERFACES (MATERIALS); METALLIC FILMS; MICROSCOPIC EXAMINATION; MOLECULAR BEAM EPITAXY; STRAIN;

BALLISTIC ELECTRON EMISSION MICROSCOPY; HOT CARRIER SCATTERING; STANDING WAVE; STOICHIOMETRIC COEVAPORATION;

ELECTRON SCATTERING;

EID: 12044255645 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.73.577 Document Type: Article

Times cited : (85)

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