Fourier analysis of X-ray micro-diffraction profiles to characterize laser shock peened metals

International Journal of Solids and Structures

Volumn 42, Issue 11-12, 2005, Pages 3471-3485

  Chen, Hongqiang ^a   Yao, Y Lawrence ^a   Kysar, Jeffrey W ^a   Noyan, I Cev ^b   Wang, Youneng ^a  

^a Department of Earth and Environmental Sciences   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Electron backscatter diffraction; Fourier analysis; Laser shock peening; X ray micro diffraction

Indexed keywords

ALUMINUM; ANNEALING; BACKSCATTERING; COMPUTER SIMULATION; COPPER; ELECTRON DIFFRACTION; FINITE ELEMENT METHOD; FOURIER TRANSFORMS; NEODYMIUM LASERS; Q SWITCHED LASERS; SHOT PEENING; SINGLE CRYSTALS; STRAIN; SYNCHROTRONS;

ELECTRON BACKSCATTER DIFFRACTION (EBSD); FOURIER ANALYSIS; LASER SHOCK PEENING (LSP); X-RAY MICRO-DIFFRACTION;

X RAY DIFFRACTION ANALYSIS;

EID: 13444309501     PISSN: 00207683     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijsolstr.2004.10.026     Document Type: Article

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