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Thin Solid Films

Volumn 475, Issue 1-2 SPEC. ISS., 2005, Pages 54-57

Characteristics of RuO2-SnO2 nanocrystalline-embedded amorphous electrode for thin film microsupercapacitors

(6) Kim, Han Ki a Choi, Sun Hee b Yoon, Young Soo c Chang, Sung Yong d Ok, Young Woo d Seong, Tae Yeon d

a Samsung SDI (South Korea)

b Korea Institute of Science and Technology (South Korea)

c Konkuk University (South Korea)

d Gwangju Institute of Science and Technology (GIST) (South Korea)

Author keywords

Capacitance; Nanocrystalline; RuO2; SnO2; Supercapacitor

Indexed keywords

AMORPHOUS FILMS; CAPACITANCE; CAPACITORS; CYCLIC VOLTAMMETRY; ELECTRODES; NANOSTRUCTURED MATERIALS; RUTHENIUM COMPOUNDS; TIN COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

NANOCRYSTALLINE-EMBEDDED AMORPHOUS ELECTRODE; RUO2; SNO2; SUPERCAPACITOR;

THIN FILMS;

EID: 13444302505 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2004.08.057 Document Type: Conference Paper

Times cited : (26)

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